Research Posters
Instrumentation and metrology for nanomechanics
An apparatus for illuminating the tip-sample interface of an AFM (2002)
Calibration method for atomic-force microscopy cantilevers (2002)
SI-traceable verification of a thermal cantilever calibration method for AFMs (2003)
An effective stiffness approximation for atomic-force microscope cantilevers (2005)
Lateral force calibration for probe microscopy (2007)
Variable-slope method of lateral force calibration (2008)
Adhesion of microsensor surfaces
Preliminary investigation of Analog Devices test structures by AFM (2002)
A study of microsensor substrates (2003)
Stiction measurements made with an atomic force microscope on test structures mounted with various die-attach materials (2003)
Quantifying the work of adhesion between an AFM cantilever tip and MEMS test structures after packaging (2004)
What's a few small bumps between friends? (2006)
Optimal roughness for minimal stiction (2007)
Effect of the roughness exponent on adhesion (2008)
Optimal roughness for minimal adhesion (2008)
Visco-elastic properties of tissue-growth substrates
Measuring the viscoelastic properties of polyacrylimide gels (2006)
UV-softening polyacrylamide substrates for spatio-temporal mechanotransduction studies (2006)
Mechanical response of molecules
Methods to study the mechanical response of carbon nanotubes with AFM (2002)
Bacteriorhodopsin and the search for molecular motion (2003)
Shear stiffness of carbon nanotubes (2004)
Exploring liquid crystal properties with AFM (2006)
Getting to the root of bacterial hair (2006)
Probing the dynamics of scapharca dimeric hemoglobin with normal mode analysis (2007)
Publications and presentations
List...
nab@wpi.edu
Last modified: June 2008