Title page for E-project-042607-101551

Project Type MQP

Submission date 2007-04-26

Authors
Colin J Degraf, PH
Keeley Marin Stevens, PH

URN E-project-042607-101551

Title Lateral Force Calibration for Probe Microscopy

Advisor
Burnham, Nancy A., PH

Availability unrestricted

Abstract
To improve the measurement of nanoscale friction, a new alternate method of lateral calibration for the atomic force microscope was examined. This method, which offers the advantage of reduced tip wear, was reviewed and analyzed, and fundamental flaws were identified in its derivation. After modifying this approach, we attempted to confirm our corrected model with a commonly accepted calibration method. The collected data displayed as yet unexplained oscillatory behavior, which showed strong correlations between lateral, drive, and error signals.

Files
LFMCalib.pdf

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Project Type	MQP
Submission date	2007-04-26
Authors	Colin J Degraf, PH Keeley Marin Stevens, PH
URN	E-project-042607-101551
Title	Lateral Force Calibration for Probe Microscopy
Advisor	Burnham, Nancy A., PH
Availability	unrestricted
Abstract To improve the measurement of nanoscale friction, a new alternate method of lateral calibration for the atomic force microscope was examined. This method, which offers the advantage of reduced tip wear, was reviewed and analyzed, and fundamental flaws were identified in its derivation. After modifying this approach, we attempted to confirm our corrected model with a commonly accepted calibration method. The collected data displayed as yet unexplained oscillatory behavior, which showed strong correlations between lateral, drive, and error signals.
Files	LFMCalib.pdf