Worcester Polytechnic Institute Electronic Projects Collection

Title page for E-project-050108-152955

Project TypeIQP
Submission date2008-05-01
Authors
  • Jatin Chopra, ECE
  • Arjun Yadav, AE
    • URNE-project-050108-152955
    DivisionTechnology and Environment
    TitleConservation and Paper Roughness of Art Artifacts
    Advisor
  • Brown, Christopher A., ME
    • Availability unrestricted

    Abstract

    Worcester Art Museum has expressed large interest in knowing if they have causing any damage to the paper after applying some type of treatment to it in an attempt to clean the paper. This paper shows measurements on different types of paper samples provided by the Worcester Art Museum. After measurements are completed, area-scale and length-scale fractal analysis are performed by the patchwork method to investigate fundamental scales on adhesion on rough substrates, in order to find differences between two types of paper.

    Surface metrology is used to discriminate surface textures that were created under different conditions or that behave differently, and to understand functional correlations involving surface textures or roughness.

    Files
  • IQP_Paper.pdf

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