Title page for ETD etd-042612-131725

Document Type	thesis
Author Name	Anderson, Evan V
Email Address	evan09 at wpi.edu
URN	etd-042612-131725
Title	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
Degree	MS
Department	Physics
Advisors	Nancy Burnham, Advisor Terri Camesano, Advisor Mingjiang Tao, Committee Member Qi Wen, Committee Member
Keywords	force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy
Date of Presentation/Defense	2012-04-25
Availability	unrestricted
Abstract This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
Files	EAnderson.pdf

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