Document Type thesis Author Name Anderson, Evan V Email Address evan09 at wpi.edu URN etd-042612-131725 Title Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis Degree MS Department Physics Advisors Nancy Burnham, Advisor Terri Camesano, Advisor Mingjiang Tao, Committee Member Qi Wen, Committee Member Keywords force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy Date of Presentation/Defense 2012-04-25 Availability unrestricted
This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
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