Worcester Polytechnic Institute Electronic Theses and Dissertations Collection

Title page for ETD etd-042612-131725

Document Typethesis
Author NameAnderson, Evan V
Email Address evan09 at wpi.edu
TitleAtomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
  • Nancy Burnham, Advisor
  • Terri Camesano, Advisor
  • Mingjiang Tao, Committee Member
  • Qi Wen, Committee Member
  • Keywords
  • force curves
  • calibration
  • analysis
  • curve fitting
  • friction
  • lateral force microscopy
  • atomic force microscopy
  • Date of Presentation/Defense2012-04-25
    Availability unrestricted


    This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.

  • EAnderson.pdf

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