Scanning Electron Microscope
The JEOL JSM-7000F is a general purpose high-performance, low cost scanning electron microscope with excellent Secondary Electron Imaging and Backscattered Electron Imaging resolution. The specimen chamber can accommodate a specimen of up to 100 mm in diameter. Operation training emphasizes manual operation, facilitating better understanding of the basic theory of operation and obtaining optimal images as the user develops skills. The SEM is equipped with Kevex energy dispersive x-ray spectroscopy system, making it suitable for microstructural and chemical analysis of advanced materials.
Materials Characterization Laboratory
JEOL JSM-7000F Scanning Electron Microscope
Last modified: Jun 01, 2014, 15:02 EDT