JEOL-100CXII Transmission Electron Microscope
The JEOL-100CXII is a conventional TEM, optimized for diffraction contrast imaging and electron diffraction studies. It operates at energy up to 100kV. A double tilt holder is available with +/-60 degrees of X tilt and +/-36 degrees of Y tilt. The TEM is used for microstructural and crystallographic studies of a wide variety of materials including metal alloys, polymers, nanostructured materials, and biomaterials.
Materials Characterization Laboratory
Transmission Electron Microscope
Last modified: Jul 12, 2012, 15:38 EDT