JEOL-100CXII Transmission Electron Microscope


The JEOL-100CXII is a conventional TEM, optimized for diffraction contrast imaging and electron diffraction studies. It operates at energy up to 100kV. A double tilt holder is available with +/-60 degrees of X tilt and +/-36 degrees of Y tilt. The TEM is used for microstructural and crystallographic studies of a wide variety of materials including metal alloys, polymers, nanostructured materials, and biomaterials.


Location: WB248
Materials Characterization Laboratory
Transmission Electron Microscope

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Last modified: Jun 01, 2014, 15:24 EDT