GE-XRD-5 diffractometer


This up-graded, computerized GE-XRD-5 diffractometer is a polycrystalline diffraction system, which has been used for crystal structure determination, precise lattice parameter measurements, phase diagram determination, determination of crystalline size and strain, quantitative analysis of powder mixtures, and residual stress analysis. A variety of software, including background modeling, peak searching, curve fitting et al and x-ray tube targets are available to provide a wide x-ray analysis capability.

Location: WB231
Materials Characterization Laboratory
GE-XRD-5 Diffractometer

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Last modified: Jul 12, 2012, 15:38 EDT