Process Monitoring and Control: A Disciplined Approach to Manufacturing Product Quality
Defining key process indicators (KPI) and methods to accurately and precisely monitor those KPIs leads to improved process stability, increased yields, and decreased scrap. Overall strategy and supporting tactics will be introduced, including monitoring approach, methods, control charting, and capability analysis. The approach flows from the reactor/output back through the process to setting the system and positioning appropriate tools to manage product quality for success.
- Presenter: Floyd E. Brownewell, Jr., PhD.
- Date: Friday, July 12, 2019
- Time: 9am – 10am
- Location: Gateway 1 – 60 Prescott Street, 1st Floor (may be GP1002 or ACD1050, depending)