Modeling and simulation with quantitative optical metrology
Fiber optics sensors, digital holography
NDT
Materials characterization
Design optimization of mechanical and microelectromechanical components and sys…
Scholarly Work
C. Furlong, “Optoelectronic holography for testing electronic packaging and MEMS,” in Optical Inspection of Microsystems, W. Osten, ed., Marcel Dekker, NY, 2006
Professional Highlights & Honors
Sigma Xi Junior Researcher Faculty
SEM
Mass. Eye & Ear Infirmary (MEEI)
Lecturer on Otology and Laryngology at Harvard Medical School
