Studying the complexities of surfaces—their textures, their roughness, their behavior—can yield a world of information in a broad range of fields, including anthropology, archeology, biomedical sciences, food science, forensics, and manufacturing. The 1st Surface Metrology Seminar for the Americas, to be held at Worcester Polytechnic Institute (WPI) Oct. 24-26, 2011, will bring together renowned experts in surface metrology to teach practitioners in these and other disciplines how to most effectively use the latest tools and technologies.
"This seminar provides a unique opportunity for anyone working with surfaces to learn from international experts in all facets of surface metrology," said Christopher Brown, professor of mechanical engineering and director of WPI's Surface Metrology Laboratory. "It is probably the best educational event ever organized for practitioners in this field. The objective is to help professionals in a broad range of areas learn new techniques that can raise the level of the surface metrology they practice."
The seminar will include two days of tutorials delivered by prominent surface metrologists from such institutions as the National Physical Laboratory in the United Kingdom, the Functional Surfaces Research Group at Halmstad and Chalmers Universities in Sweden ("Surface Engineering for Product Development"), John Jay College of Criminal Justice ("Pattern Recognition for Forensic Firearms and Tool Mark Analysis"), the Laboratory of Tribology and Dynamics of Systems at the University of Lyon in France, the Department of Anthropology at Keene State College in Keene, N.H., and KAIST in South Korea.
Topics will include surface texture characterization, applying statistical analysis to surface characterization, interferometry, finite element modeling of surface behavior, and correlation of surface characteristics with process and performance data.
The seminar will also include a research poster session and an open meeting of the American Society for Mechanical Engineers (ASME) B46, the Committee for Classification and Designation of Surface Qualities.
For a complete schedule, visit http://www.surfacemetrology.org/2011/schedule.shtml.