Surface Metrology 2018 WPI Short course, Workshop and Exhibition

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Chris Brown alt
Chris Brown
Wednesday, June 27, 2018
9:30 am to 5:00 pm
Floor/Room #: 
SL104/105

June 27 and 28, Wednesday and Thursday

Surface Metrology 2018 WPI
Short course, Workshop and Exhibition


WPI main campus: Salisbury labs lounge and rooms 104 and 105

Prof. Christopher A. Brown, PhD., FASME

Surfaces cover everything, and their topographies influence behavior and are influenced by manufacturing and use. Despite the importance of topographies, much is still not understood about how best to measure and analyze them.
This event is to learn about how to measure, characterize and analyze topographies in order to understand how they perform, and how they were created. It is intended for engineers, researchers, scientists, technicians, students, professors, and managers. It is for people who are working in product and process design, quality assurance, as well as in forensics and a variety of scientific applications, like archeology, anthropology, paleontology, geography, and art conservation.
The short course covers fundamental principles of surface metrology, including conventional and multiscale. Participants can apply to present their research and topographic challenges for discussion in the workshops. There may also be opportunities to make measurements and do analyses during the workshop with the exhibitors.
In addition there will be a discussion on an International Industrial-Academic Consortium for Surface Metrology with an initial Center at WPI.

Registration

https://fs28.formsite.com/webteamwpiedu/surfmet-reg/index.html

Day one: Wednesday 27 June

9:30 -10:00 Registration and coffee
10:00-11:00 One: Basics of Surface Metrology and Conventional Characterization
11:00-12:00 Two: Measurement basics and Filtering
12:00-1:30 Three: Exhibitors’ presentations, exhibits and lunch
1:30-2:00 Four: Functional Correlations and Discriminations
2:00-2:30 Five: Morphological filtering with Dr. Mark Malburg
2:30-3:00 Exhibits and coffee, sponsored by ZYGO Corporation
3:00-4:00 Six: Multiscale Geometric Characterizations
4:00-4:45 Seven: Multiscale Functional Correlations and Discrimination
4:45-5:00 Eight: International Industrial-Academic Consortium for Surface Metrology
5:00-6:30 Exhibits, Popcorn and maple sodas
7:00 Dinner at the Fix (cost not included in registration)

Day two, Thursday 28 June

8:30-9:00 Nine: Specifying and tolerancing topographies
9:00-9:30 Ten: Surfaces from additive manufacturing
9:30-10:00 Eleven: Outliers and what to do about them
10:00–10:30 Exhibits and coffee
10:30-11:00 Twelve: Selecting measurement, characterization and analysis parameters for research
11:00-11:30 Thirteen: Using MountainsMap with Matt Gleason, WPI
11:30-12:15 Fourteen: Workshop and case studies I
12:15-1:15 Exhibits and lunch
1:15-3:00 Fifteen: Workshop and case studies II
3:00-3:15 Sixteen: Synopsis and concluding remarks

Events

  • Thursday, June 28, 2018
    8:30am to 3:15pm

    Surface Metrology 2018 WPI Short course, Workshop and Exhibition Day Two

    June 27 and 28, Wednesday and Thursday

    Surface Metrology 2018 WPI

    Short course, Workshop and Exhibition

    WPI main campus: Salisbury labs lounge and rooms 104 and 105
    Prof. Christopher A. Brown, PhD., FASME
    Surfaces cover everything, and their topographies influence behavior and are influenced by manufacturing and use. Despite the importance of topographies, much is still not understood about how best to measure and analyze them.
    This event is to learn about how to measure, characterize and analyze topographies in order to understand how they perform, and how they were created. It is intended for engineers, researchers, scientists, technicians, students, professors, and managers. It is for people who are working in product and process design, quality assurance, as well as in forensics and a variety of scientific applications, like archeology, anthropology, paleontology, geography, and art conservation.
    The short course covers fundamental principles of surface metrology, including conventional and multiscale. Participants can apply to present their research and topographic challenges for discussion in the workshops. There may also be opportunities to make measurements and do analyses during the workshop with the exhibitors.
    In addition there will be a discussion on an International Industrial-Academic Consortium for Surface Metrology with an initial Center at WPI.

    Registration
    https://fs28.formsite.com/webteamwpiedu/surfmet-reg/index.html

    Day one: Wednesday 27 June


    9:30 -10:00 Registration and coffee
    10:00-11:00 One: Basics of Surface Metrology and Conventional Characterization
    11:00-12:00 Two: Measurement basics and Filtering
    12:00-1:30 Three: Exhibitors’ presentations, exhibits and lunch
    1:30-2:00 Four: Functional Correlations and Discriminations
    2:00-2:30 Five: Morphological filtering with Dr. Mark Malburg
    2:30-3:00 Exhibits and coffee, sponsored by ZYGO Corporation
    3:00-4:00 Six: Multiscale Geometric Characterizations
    4:00-4:45 Seven: Multiscale Functional Correlations and Discrimination
    4:45-5:00 Eight: International Industrial-Academic Consortium for Surface Metrology
    5:00-6:30 Exhibits, Popcorn and maple sodas
    7:00 Dinner at the Fix (cost not included in registration)

    Day two, Thursday 28 June


    8:30-9:00 Nine: Specifying and tolerancing topographies
    9:00-9:30 Ten: Surfaces from additive manufacturing
    9:30-10:00 Eleven: Outliers and what to do about them
    10:00–10:30 Exhibits and coffee
    10:30-11:00 Twelve: Selecting measurement, characterization and analysis parameters for research
    11:00-11:30 Thirteen: Using MountainsMap with Matt Gleason, WPI
    11:30-12:15 Fourteen: Workshop and case studies I
    12:15-1:15 Exhibits and lunch
    1:15-3:00 Fifteen: Workshop and case studies II
    3:00-3:15 Sixteen: Synopsis and concluding remarks

    View Event Register
Registration Deadline:
Tuesday, June 26, 2018 12:00 pm
Name: 
Chris Brown
Email: